DocumentCode :
2888698
Title :
Efficient method for characterization of various thermal interface materials
Author :
Cummings, M. ; Shephard, N. ; Su, K. ; Bhagwagar, D.
Author_Institution :
Dow Corning Corp., Midland, MI, USA
fYear :
2010
fDate :
2-5 June 2010
Firstpage :
1
Lastpage :
6
Abstract :
An increased demand for high performance Thermal Interface Materials (TIMs) has been stimulated by a trend of higher power electronic designs producing significant amounts of heat. Defining the best TIM for an application requires consideration of several factors including thermal and mechanical performance, ease of assembly, reliability, and cost. The focus of this paper includes discussions of a high-throughput method for characterization of the thermal performance of materials and the properties of several thermal interface materials including grease, adhesives and Phase Change Materials (PCM).
Keywords :
adhesives; greases; phase change materials; thermal conductivity; thermal resistance; TIM; adhesives; assembly; grease; high performance thermal interface materials; high-throughput method; phase change materials; reliability; thermal conductivity; thermal resistance; Assembly; Conducting materials; Electrical resistance measurement; Electronic packaging thermal management; Optical materials; Phase change materials; Substrates; Thermal conductivity; Thermal resistance; Thickness measurement; adhesives; grease; guarded hot plate; laser flash; phase change material or PCM; silicone; thermal conductivity; thermal interface materials or TIM; thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1087-9870
Print_ISBN :
978-1-4244-5342-9
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2010.5501344
Filename :
5501344
Link To Document :
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