Title :
Low overhead built-in testable error detection and correction with excellent fault coverage
Author :
Katoozi, M. ; Nordsieck, A.
Keywords :
Aerospace electronics; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Error correction; Error correction codes; Fault detection; Protection; System testing;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Conference_Location :
Nashville, TN, USA
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519900
