Electromagnetic plane wave diffraction by a three-layer material loaded slit

This paper examines electromagnetic plane wave diffraction by a three-layer dielectric material loaded slit on infinitely long perfect electric conductor (PEC) screen. Here, the Kobayashi Potential (KP) method, which is an analytical eigen function expansion method in terms of the discontinuous characteristics of Weber-Schafheitlin type integrals, is utilized for the analysis. The derived solution obtained by the KP method provides us with precise numerical results, so it may be regarded as a reference solution to other high frequency approximations and numerical techniques. We examine the detailed scattering and diffraction features of the partially loaded slit for H-polarized plane wave incidence, by comparing the results for this analysis with those for empty and material filled cases.