DocumentCode
2889156
Title
Tutorial 6: Design Challenges and Solutions for Nanoscale Memories
Author
Sridhar, Ramalingam ; Elakkumanan, Praveen ; Natarajan, Sreedhar
Author_Institution
University at Buffalo, (SUNY), Buffalo, NY
fYear
2007
fDate
27-30 May 2007
Abstract
Static Random-Access Memory (SRAM) is a dominant memory technology for embedded CMOS-memory applications. As device channel lengths shrink down to tens of nanometers, SRAM designs meet new issues and challenges that require changes in the way designs are done. The goal of the tutorial is threefold: 1. Present the design challenges and summarize various circuit-design techniques for low leakage and high performance memory design; 2. A detailed discussion on SRAM failure mechanisms to understand the impact of process variations, soft errors, leakage and noise on different memory operations; the speakers will reexamine these scaling issues, their impact on cell operation and stability, and design for manufacturability within these constraints; and 3. Discuss future and emerging memory technology trends and what they may mean for low power and robustness concerns - with an emphasis on those aspects that are relevant to SRAM designers.
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA, USA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.378119
Filename
4252547
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