DocumentCode
2889194
Title
Tutorial 12: Challenges and Opportunities of Digital Design in Nanoscale CMOS
Author
Chuang, Ching-Te Kent
Author_Institution
IBM, New York, USA
fYear
2007
fDate
27-30 May 2007
Abstract
This tutorial reviews the challenges and opportunities of high-performance digital design in nanoscale CMOS technologies. The device structure evolution, material enhancement, and major design challenges are discussed. Examples of logic circuit and SRAM design techniques to overcome the challenges and to mitigate various performance/reliability constraints in conventional planar CMOS technology are given. Scaled/emerging technologies such as scaled PD/SOI, UT/SOI, strained-Si channel device, hybrid orientation technology, and multi-gate FinFET are addressed with particular emphases on the implications and impacts on circuit design. Finally, novel logic circuit, SRAM, and power-gating schemes exploiting unique structures and properties of emerging devices are discussed.
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA, USA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.378121
Filename
4252549
Link To Document