Title :
Orthotropic thermal conductivity and Joule heating effects on the temperature distribution of printed circuit boards
Author :
Shankaran, Gokul V. ; Dogruoz, M. Baris ; deAraujo, Daniel
Author_Institution :
Ansys Inc., Austin, TX, USA
Abstract :
A printed circuit board (PCB) comprises alternating layers of dielectric material and current carrying traces and vias. As performing system-level simulations of PCB´s with detailed trace and via geometries is very costly, the present approach considers the effects of the trace and via geometry in the physical model by importing ECAD data consisting of the trace and via layout of the board and determines locally varying orthotropic conductivity (kx, ky and kz) on the printed circuit board based on the ECAD data. In addition, the present approach considers the effects of Joule heating in the current carrying traces by utilizing multiple 2-D sources where the powermap is determined by solving the governing electric field equations on the trace. In this paper, the effects of both trace layer orthotropic thermal conductivity and Joule heating are studied on a sample PCB. Comparisons are made with earlier studies and conventional models when possible. It is shown that location of the hot spots and temperature values differ substantially if different methods are used.
Keywords :
printed circuits; thermal conductivity; ECAD data; Joule heating effects; dielectric material; electric field equations; multiple 2D sources; printed circuit boards; system-level simulations; temperature distribution; trace layer orthotropic thermal conductivity; Circuit simulation; Dielectric materials; Electronic design automation and methodology; Equations; Geometry; Printed circuits; Resistance heating; Solid modeling; Temperature distribution; Thermal conductivity; DC electric current; Static IR Drop; lumped Joule heating; lumped PCB model; mapped Joule heating; orthotropic; thermal conductivity; trace; trace PCB model;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-5342-9
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2010.5501370