Title :
On-chip Peltier cooling using current pulse
Author :
Gupta, Man Prakash ; Sayer, Min-Hee S. ; Mukhopadhyay, Saibal ; Kumar, Satish
Author_Institution :
Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Thermoelectric coolers (TECs) can address an efficient removal of localized heat for a wide range of applications such as microelectronic processors, DNA micro arrays, lasers. The efficient usage of thermoelectric devices for these applications require investigation and remedy of various obstacles such as integration of these devices with electronic package, parasitic contact resistances and utilization of appropriate current pulses and control algorithms. We investigate the effect of steady state and transient mode of operation of ultrathin TEC devices on hot spot temperature reduction on a chip through a developed computational model. The numerical model incorporates the effect of thermal and electrical contact resistances to analyze the hot spot cooling. Our analysis shows that transient pulses can be very effective to reduce the hotspot temperature in addition to the cooling achieved by the steady state current through the device. Thermal and electrical contact resistance play a very crucial role in the performance of TEC devices as high values of these resistances can completely diminish the effect of Peltier cooling. The effect of these parasitic resistances is even higher for the transient cooling of hot-spots by the pulsed current through the device compared to the steady state operation.
Keywords :
Peltier effect; contact resistance; cooling; thermal management (packaging); thermoelectric devices; current pulse; electrical contact resistance; electronic package; hot spot cooling; hot spot temperature reduction; hotspot temperature; on-chip Peltier cooling; parasitic contact resistances; parasitic resistances; pulsed current; thermal contact resistance; thermoelectric coolers; thermoelectric devices; transient cooling; transient mode; transient pulses; ultrathin TEC devices; Contacts; Cooling; DNA; Electronic packaging thermal management; Microelectronics; Steady-state; Temperature; Thermal resistance; Thermoelectricity; Transient analysis; Contact; Electrical; Hot-spot; Resistance; Thermal; Thermoelectric; Transient;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-5342-9
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2010.5501384