Title :
One way or two way globalization?-a double-learning-network framework of Chinese R&D internationalization
Author :
Minin, Alberto Di ; Zhang, Jieyin
Author_Institution :
Univ. of California, Berkeley, CA, USA
Abstract :
In this paper we claim that the phenomenon of R&D internationalization of Chinese firms is an emerging and varied phenomenon. We establish a four-pattern learning model in a double-knowledge-network organization, and propose that both different modes (experiential and cooperative) and different goals (explorative and exploitative) coexist in Chinese R&D internationalization. The evolution of both modes and goals of learning of Chinese MNCs are different from that of the MNCs from developed countries. Our study tends to set the stage for further empirical studies in the causalities and managerial implications.
Keywords :
globalisation; knowledge management; organisational aspects; research and development; Chinese R&D internationalization; Chinese firms; double-learning-network framework; four-pattern learning model; globalization; Bidirectional control; Collaboration; Consumer electronics; Fault detection; Forward contracts; Investments; Knowledge transfer; Manufacturing; Research and development; Technological innovation;
Conference_Titel :
Science and Innovation Policy, 2009 Atlanta Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-5041-1
Electronic_ISBN :
978-1-4244-5042-8
DOI :
10.1109/ACSIP.2009.5367844