DocumentCode :
2889876
Title :
Delphi style compact modeling for multi-chip package including its bottom board area based on genetic algorithm optimization
Author :
Monier-vinard, Eric ; Bissuel, Valentin ; Murphy, Paul ; Daniel, Olivier ; Dufrenne, Julien
Author_Institution :
THALES Corp. SERVICES, Meudon la foret, France
fYear :
2010
fDate :
2-5 June 2010
Firstpage :
1
Lastpage :
10
Abstract :
Emerging packages offer diverse options for mounting active and passive devices in a single package, such as side by side, embedded or stacked die placements. These high density packages have increased the cooling issues and are demanding more complex board designs to transfer the heat from the chips to the PCB ground planes. The creation of the most compliant behavioral models to a set of DELPHI boundary conditions has been investigated using the Genetic Algorithm fitting technique. The paper describes the comparison of compact and detailed models, dedicated to System in Package component, and the need to simulate in more detail the package and its chips, as well as, the layers, via and μvia of its board mounting area. The thermal behavior predictions, found to be within ±5% of error, show the compliance of Genetic Algorithm for reducing complex multi-chip packages and the feasibility of extending the "Boundary Condition Independence" methodology to the modeling of local board areas. In addition, the use of "local board compact thermal model" linked to each critical component proposes a new way to achieve a more efficient and accurate board cooling optimization.
Keywords :
genetic algorithms; printed circuits; system-in-package; Delphi style compact modeling; PCB ground planes; active devices; board mounting area; bottom board area; boundary condition independence; complex board designs; complex multichip packages; cooling optimization; genetic algorithm fitting technique; genetic algorithm optimization; local board compact thermal model; multichip package; passive devices; system in package component; thermal behavior; Boundary conditions; Cooling; Electronic components; Electronic packaging thermal management; Electronics packaging; Genetic algorithms; Predictive models; Temperature; Thermal conductivity; Thermal resistance; Compact; algorithm; genetic; model; thermal;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1087-9870
Print_ISBN :
978-1-4244-5342-9
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2010.5501405
Filename :
5501405
Link To Document :
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