• DocumentCode
    2889876
  • Title

    Delphi style compact modeling for multi-chip package including its bottom board area based on genetic algorithm optimization

  • Author

    Monier-vinard, Eric ; Bissuel, Valentin ; Murphy, Paul ; Daniel, Olivier ; Dufrenne, Julien

  • Author_Institution
    THALES Corp. SERVICES, Meudon la foret, France
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Emerging packages offer diverse options for mounting active and passive devices in a single package, such as side by side, embedded or stacked die placements. These high density packages have increased the cooling issues and are demanding more complex board designs to transfer the heat from the chips to the PCB ground planes. The creation of the most compliant behavioral models to a set of DELPHI boundary conditions has been investigated using the Genetic Algorithm fitting technique. The paper describes the comparison of compact and detailed models, dedicated to System in Package component, and the need to simulate in more detail the package and its chips, as well as, the layers, via and μvia of its board mounting area. The thermal behavior predictions, found to be within ±5% of error, show the compliance of Genetic Algorithm for reducing complex multi-chip packages and the feasibility of extending the "Boundary Condition Independence" methodology to the modeling of local board areas. In addition, the use of "local board compact thermal model" linked to each critical component proposes a new way to achieve a more efficient and accurate board cooling optimization.
  • Keywords
    genetic algorithms; printed circuits; system-in-package; Delphi style compact modeling; PCB ground planes; active devices; board mounting area; bottom board area; boundary condition independence; complex board designs; complex multichip packages; cooling optimization; genetic algorithm fitting technique; genetic algorithm optimization; local board compact thermal model; multichip package; passive devices; system in package component; thermal behavior; Boundary conditions; Cooling; Electronic components; Electronic packaging thermal management; Electronics packaging; Genetic algorithms; Predictive models; Temperature; Thermal conductivity; Thermal resistance; Compact; algorithm; genetic; model; thermal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501405
  • Filename
    5501405