• DocumentCode
    288991
  • Title

    Classical dependence analysis techniques: sufficiently accurate in practice

  • Author

    Psarris, Kleanthis ; Pande, Santosh

  • Author_Institution
    Div. of Comput. Sci., Texas Univ., San Antonio, TX, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    3-6 Jan 1995
  • Firstpage
    123
  • Abstract
    Data dependence analysis is the foundation of any parallelizing compiler. The GCD (greatest common divisor) test and the Banerjee-Wolfe test (U. Banerjee 1988, M. Wolfe 1989) are the two tests traditionally used to determine statement data dependence in automatic vectorization/parallelization of loops. These tests are approximate in the sense that they are necessary but not sufficient conditions for data dependence. In an earlier work (Proc. 6th ACM Int. Conf. Supercomputing, Washington, DC, USA, July 1992), we extended the Banerjee-Wolfe test and a combination of the GCD and Banerjee-Wolfe tests with a set of conditions to derive exact data dependence information. In this paper, we perform an empirical study on the Perfect benchmarks to demonstrate the effectiveness and practical importance of our conditions. We show that the Banerjee-Wolfe test extended with our conditions becomes an exact test for data dependence in actual practice
  • Keywords
    data analysis; parallelising compilers; program control structures; program diagnostics; program testing; Banerjee-Wolfe test; GCD test; Perfect benchmarks; accuracy; automatic loop parallelization; automatic vectorization; data dependence analysis; exact test; greatest common divisor; parallelizing compilers; statement data dependence; sufficient conditions; Automatic testing; Benchmark testing; Computer science; Data analysis; Equations; Linear programming; NP-hard problem; Performance analysis; Program processors; Sufficient conditions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Sciences, 1995. Proceedings of the Twenty-Eighth Hawaii International Conference on
  • Conference_Location
    Wailea, HI
  • Print_ISBN
    0-8186-6930-6
  • Type

    conf

  • DOI
    10.1109/HICSS.1995.375470
  • Filename
    375470