Title :
Automated parameter extraction software for advanced IGBT modeling
Author :
Hefner, A., Jr. ; Bouché, S.
Author_Institution :
Div. of Semicond. Electron., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
A software package for extracting parameters to be used in advanced IGBT models is presented. In addition, new model equations and extraction procedures are introduced that more accurately describe a wide range of IGBT types including the Warp-Speed IGBTs. The parameter extraction software package consists of five programs that extract the 20 physical and structural parameters needed in the most recent version of the Hefner IGBT model. Each program has a graphical user interface and uses the IEEE 488 bus to control the measurement instruments. Various algorithms are employed for fitting the IGBT model equations to measured data. The new software package enables users of the simulation software products to extract model parameters themselves and thus permits the simulation of new IGBT part numbers as soon as they are introduced
Keywords :
computerised instrumentation; electronic engineering computing; graphical user interfaces; insulated gate bipolar transistors; peripheral interfaces; semiconductor device models; software packages; Hefner IGBT model; IEEE 488 bus; IGBT models; IMPACT software package; Warp-Speed IGBT; advanced IGBT modeling; automated parameter extraction software; graphical user interface; measurement instruments control; model equations; physical parameters; software package; structural parameters; Circuit simulation; Data mining; Electric variables measurement; Equations; Graphical user interfaces; Insulated gate bipolar transistors; NIST; Parameter extraction; Software packages; Structural engineering;
Conference_Titel :
Computers in Power Electronics, 2000. COMPEL 2000. The 7th Workshop on
Conference_Location :
Blacksburg, VA
Print_ISBN :
0-7803-6561-5
DOI :
10.1109/CIPE.2000.904684
