DocumentCode :
2890191
Title :
Quality measurement and reporting system
Author :
Neader, Kathleen A.
Author_Institution :
IBM, Essex Junction, VT, USA
fYear :
1989
fDate :
22-24 May 1989
Firstpage :
92
Lastpage :
94
Abstract :
A guide for evaluating the benefits of the quality measurement and reporting system currently in use at IBM´s facility in Essex Junction, Vermont, is presented. Due to the needs of business to maintain a higher quality level in the manufacturing environment, a flexible and easily maintained quality control system became a necessity. A system was installed to meet the needs of all levels of management, engineering, and manufacturing personnel while providing timely and consistent data in a super-friendly environment. The quality measurement system looks at various aspects critical to a semiconductor manufacturing line. Process compliance, product reliability, documentation, foreign material on wafers, and environmental contamination are some examples. The quality reporting system uses IBM software applications. The structured query language (SQL) and query management facility (QMF) are the applications used for data management. The data are stored in relational databases which, combined with the use of SQL and QMF, create a highly efficient and flexible system
Keywords :
integrated circuit manufacture; quality control; relational databases; Essex Junction; IBM; QMF; SQL; data management; documentation; environmental contamination; product reliability; quality control system; quality measurement system; quality reporting system; query management facility; relational databases; semiconductor manufacturing line; structured query language; super-friendly environment; Application software; Current measurement; Data engineering; Engineering management; Environmental management; Flexible manufacturing systems; Maintenance engineering; Pollution measurement; Quality control; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Science Symposium, 1989. ISMSS 1989., IEEE/SEMI International
Conference_Location :
Burlingame, CA
Type :
conf
DOI :
10.1109/ISMSS.1989.77252
Filename :
77252
Link To Document :
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