• DocumentCode
    28903
  • Title

    The Breakdown Characteristics of Single-Gap Pseudospark Discharge Under Nanosecond Pulsed Voltages

  • Author

    Jia Zhang ; Junping Zhao ; Qiaogen Zhang

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
  • Volume
    42
  • Issue
    8
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    2037
  • Lastpage
    2041
  • Abstract
    In this paper, an experimental investigation of pseudospark discharge behaviors was conducted under nanosecond pulsed voltages using a flexible discharge chamber. The breakdown voltages of the pseudospark discharge gap were measured for a wide range of gas pressures, anode-cathode gap distances, and cathode aperture diameters to find the match of gap distance and cathode aperture diameter at a certain gas pressure with the nanosecond pulsed voltage. According to the experimental results, an empirical relationship was obtained. The roles of the parameters in the empirical relationship during the discharge were analyzed. The breakdown characteristics were also consistent with the Paschen´s law in the pseudospark under nanosecond pulsed voltages, when the gap distance was replaced by the effective gap distance. In the end, a possible reason was put forward to explain the difference between the empirical relationships obtained under dc voltages and nanosecond pulsed voltages.
  • Keywords
    anodes; cathodes; plasma pressure; sparks; Paschen´s law; anode-cathode gap distances; breakdown characteristics; cathode aperture diameters; dc voltages; flexible discharge chamber; nanosecond pulsed voltages; single-gap pseudospark discharge; Apertures; Breakdown voltage; Cathodes; Discharges (electric); Electron beams; Plasmas; Breakdown characteristics; effective gap distance; nanosecond pulsed voltages; single-gap pseudospark discharge; single-gap pseudospark discharge.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2014.2323473
  • Filename
    6823755