Abstract :
The following topics are dealt with: multicores; memory BIST; reliability evaluation; digital integrated circuits; and error correction.
Keywords :
built-in self test; digital integrated circuits; error correction; integrated circuit reliability; digital integrated circuits; error correction; memory BIST; multicores; reliability evaluation;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993791
