Title :
Superconductive devices and electrical measurements at low temperatures
Author_Institution :
National Research Council of Canada, Ottawa, Canada
Keywords :
Circuits; Detectors; Electric variables measurement; Electrical resistance measurement; Noise level; Superconducting coils; Superconductivity; Switches; Temperature measurement; Thermal resistance;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1960 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1960.1157259