Title :
Low-power design under variation using error prevention and error tolerance (invited paper)
Author :
Chae, Kwanyeob ; Cho, Minki ; Mukhopadhyay, Saibal
Author_Institution :
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA-30332
Abstract :
This paper presents error tolerance and error prevention methodologies to reduce power dissipation in digital circuits under process variations. For logic circuits, timing error prevention using time-borrowing and clock stretching is discussed as a feasible approach to reduce power dissipation for a target throughput. The natural error tolerance in image processing applications is exploited to reduce power dissipations in Static Random Access Memory (SRAM).
Conference_Titel :
Test Workshop (LATW), 2012 13th Latin American
Conference_Location :
Quito, Ecuador
Print_ISBN :
978-1-4673-2355-0
DOI :
10.1109/LATW.2012.6261232