DocumentCode :
2890586
Title :
A new IP core for fast error detection and fault tolerance in COTS-based solid state mass memories
Author :
Costenaro, Enrico ; Violante, Massimo ; Alexandrescu, Dan
Author_Institution :
iRoC Technol., Grenoble, France
fYear :
2011
fDate :
13-15 July 2011
Firstpage :
49
Lastpage :
54
Abstract :
Commercial-off-the-shelf (COTS) components are crucial for the success of future space missions as, although not being specifically designed for space, they are the only components able to meet the performance requirement that new missions impose to designers. COTS memories are particularly appealing as large memory arrays can be implemented, which can be made immune to radiations by means of cost-effective information redundancy schemes. In this paper, we present an intellectual property (IP) core implementing a (12, 8) Reed-Solomon (RS) code for error mitigation that is suitable for COTS Flash NAND and NOR memories. The main novelty of the proposed scheme consists in its architecture which is based on a shortened Reed-Solomon code with a fast error detection feature. Two implementations have been studied: a fully combinational scheme that provides error detection and correction in the access cycle and a two-stage pipeline with early (in-cycle) error detection a 1-cycle latency correction. The pipelined version presents the specific advantages of minimizing the time penalty associated to a traditional RS implementation. We have characterized the area and timing performance of the proposed architectures in a variety of FPGA implementations, obtaining a maximum frequency of 47 MHz for the combinational implementation and 53 MHz for the pipelined one (in a Virtex 6 FPGA), with a quick 5 ns error detection. In addition, we have characterized the fault resiliency of the proposed schemes with respect to Single Event Transients and Single Event Faults.
Keywords :
NAND circuits; NOR circuits; Reed-Solomon codes; error correction codes; error detection; fault tolerance; field programmable gate arrays; flash memories; industrial property; integrated circuit reliability; redundancy; COTS flash NAND memory; COTS-based solid state mass memories; FPGA; IP core; NOR memory; Reed-Solomon code; commercial-off-the-shelf components; cost-effective information redundancy schemes; error correction codes; fast error detection; fault tolerance; frequency 47 MHz; frequency 53 MHz; intellectual property; memory arrays; one-cycle latency correction; single event faults; single event transients; time 5 ns; Circuit faults; Clocks; Decoding; Field programmable gate arrays; Flash memory; Integrated circuit modeling; Reed-Solomon codes; Error correction; FPGA; Flash memory; IP core; Reed-Solomon code; fault tolerant memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
Type :
conf
DOI :
10.1109/IOLTS.2011.5993810
Filename :
5993810
Link To Document :
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