• DocumentCode
    2890654
  • Title

    Automatic generation of an FPGA based embedded test system for printed circuit board testing

  • Author

    Escobar, J. -H Meza ; SachBe, J. ; Ostendorff, S. ; Wuttke, H. -D

  • Author_Institution
    Integrated Communication Systems Group, Ilmenau University of Technology, Germany
  • fYear
    2012
  • fDate
    10-13 April 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper describes an FPGA based embedded test system, designed for testing of printed circuit boards during the manufacturing process. The test system architecture is automatically generated based on a layer description, which provides the required flexibility for the generation of the test system, and for the abstraction of the test functions. The test system is composed of a software and a hardware part, and generated based on the board´s properties and the specified test algorithms. The paper presents the test system architecture and automatic generation flow, with emphasis on the software generation process. The paper also includes experimental results obtained when performing an SRAM interconnection test.
  • Keywords
    automatic test equipment; boundary scan; embedded test system; field programmable gate arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop (LATW), 2012 13th Latin American
  • Conference_Location
    Quito, Ecuador
  • Print_ISBN
    978-1-4673-2355-0
  • Type

    conf

  • DOI
    10.1109/LATW.2012.6261241
  • Filename
    6261241