DocumentCode
2890654
Title
Automatic generation of an FPGA based embedded test system for printed circuit board testing
Author
Escobar, J. -H Meza ; SachBe, J. ; Ostendorff, S. ; Wuttke, H. -D
Author_Institution
Integrated Communication Systems Group, Ilmenau University of Technology, Germany
fYear
2012
fDate
10-13 April 2012
Firstpage
1
Lastpage
6
Abstract
This paper describes an FPGA based embedded test system, designed for testing of printed circuit boards during the manufacturing process. The test system architecture is automatically generated based on a layer description, which provides the required flexibility for the generation of the test system, and for the abstraction of the test functions. The test system is composed of a software and a hardware part, and generated based on the board´s properties and the specified test algorithms. The paper presents the test system architecture and automatic generation flow, with emphasis on the software generation process. The paper also includes experimental results obtained when performing an SRAM interconnection test.
Keywords
automatic test equipment; boundary scan; embedded test system; field programmable gate arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop (LATW), 2012 13th Latin American
Conference_Location
Quito, Ecuador
Print_ISBN
978-1-4673-2355-0
Type
conf
DOI
10.1109/LATW.2012.6261241
Filename
6261241
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