DocumentCode
2890793
Title
Classification of light charged particles in a nuclear physics experiment
Author
Previdi, F. ; Savaresi, S.M. ; Guazzoni, P. ; Zetta, L.
fYear
2008
fDate
3-5 Sept. 2008
Firstpage
1177
Lastpage
1182
Abstract
The problem considered in this work is pulse shape discrimination in a nuclear physics experiment. Each nucleus produced in the collision of a heavy ion beam over a target enters a detector and creates a light pulse signal measured by a digital acquisition system. The pulse shape contains complete information on the hitting particle, but it includes also the dynamics of the charge preamplifier used in the measurement. In this work, a complete procedure for the particle identification is proposed. First, a model of the charge preamplifier is estimated using experiments specifically devoted to this aim. Then, the measured pulses are filtered through the inverse model of the preamplifier and, then, a subspace method is used to estimate a linear model of the light generation process in the detector. Finally, the expectation-maximization algorithm is used for particle classification on the basis of the estimated parameters of the light pulses. This work focuses on light charged particles (LCP), which are the most difficult to detect and to classify. All the experiments are made with the large detector array CHIMERA (charge heavy ions mass and energy resolving array).
Keywords
expectation-maximisation algorithm; nuclear electronics; nuclear engineering computing; preamplifiers; charge heavy ions mass and energy resolving array; charge preamplifiers; digital acquisition system; expectation-maximization algorithm; light charged particle classification; nuclear physics experiments; pulse shape discrimination; subspace method; Charge measurement; Current measurement; Ion beams; Nuclear measurements; Nuclear physics; Preamplifiers; Pulse measurements; Pulse shaping methods; Sensor arrays; Shape measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Control Applications, 2008. CCA 2008. IEEE International Conference on
Conference_Location
San Antonio, TX
Print_ISBN
978-1-4244-2222-7
Electronic_ISBN
978-1-4244-2223-4
Type
conf
DOI
10.1109/CCA.2008.4629621
Filename
4629621
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