Title :
Collocated Z-Axis Control of a High-Speed Nanopositioner for Video-Rate Atomic Force Microscopy
Author :
Yuen Kuan Yong ; Moheimani, S. O. Reza
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Univ. of Newcastle, Callaghan, NSW, Australia
Abstract :
A key hurdle to achieve video-rate atomic force microscopy (AFM) in constant-force contact mode is the inadequate bandwidth of the vertical feedback control loop. This paper describes techniques used to increase the vertical tracking bandwidth of a nanopositioner to a level that is sufficient for video-rate AFM. These techniques involve the combination of: a high-speed XYZ nanopositioner; a passive damping technique that cancels the inertial forces of the Z actuator which in turns eliminates the low 20-kHz vertical resonant mode of the nanopositioner; an active control technique that is used to augment damping to high vertical resonant modes at 60 kHz and above. The implementation of these techniques allows a tenfold increase in the vertical tracking bandwidth, from 2.3 (without damping) to 28.1 kHz. This allows high-quality, video-rate AFM images to be captured at 10 frames/s without noticeable artifacts associated with vibrations and insufficient vertical tracking bandwidth.
Keywords :
atomic force microscopy; damping; feedback; image capture; nanopositioning; physical instrumentation control; tracking; video signal processing; Z actuator inertial forces; active control technique; collocated z-axis control; constant-force contact mode; frequency 2.3 kHz; frequency 20 kHz; frequency 28.1 kHz; frequency 60 kHz; high-quality video-rate AFM image capture; high-speed XYZ nanopositioner; passive damping technique; vertical feedback control loop; vertical resonant modes; vertical tracking bandwidth; video-rate atomic force microscopy; Actuators; Bandwidth; Damping; Gain; Nanopositioning; Resonant frequency; Vibrations; Atomic Force Microscopy; Atomic force microscopy; Video-rate; constant-force; flexure; nanopositioning; video-rate;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2015.2394327