Title :
An FPGA-based framework for run-time injection and analysis of soft errors in microprocessors
Author :
Sauer, M. ; Tomashevich, V. ; Müller, J. ; Lewis, M. ; Spilla, A. ; Polian, I. ; Becker, B. ; Burgard, W.
Author_Institution :
Albert-Ludwigs-Univ., Freiburg, Germany
Abstract :
State-of-the-art cyber-physical systems are increasingly deployed in harsh environments with non-negligible soft error rates, such as aviation or search-and-rescue missions. State-of-the-art nanoscale manufacturing technologies are more vulnerable to soft errors. In this paper, we present an FPGA-based framework for injecting soft errors into user-specified memory elements of an entire microprocessor (MIPS32) running application software. While the framework is applicable to arbitrary software, we demonstrate its usage by characterizing soft errors effects on several software filters used in aviation for probabilistic sensor data fusion.
Keywords :
field programmable gate arrays; microprocessor chips; nanoelectronics; sensor fusion; FPGA-based framework; MIPS32 running application software; arbitrary software; aviation; cyber-physical systems; microprocessors; probabilistic sensor data fusion; run-time injection; soft error analysis; soft error rates; software filters; state-of-the-art nanoscale manufacturing technologies; user-specified memory elements; Circuit faults; Field programmable gate arrays; Hardware; Kalman filters; Robot sensing systems; Software;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993836