Title :
An on-line memory state validation using shadow memory cloning
Author :
Baklashov, Mikhail
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
This paper describes an on-line memory and CPU register state validation methodology in virtualized simulated environments where an Instruction Set Simulator (ISS) executes native applications on top of Operating System (OS) and dynamic translation is enabled. A Virtual System Prototyping (VSP) environment models a platform providing host memory pointers and a CPU core requesting read, write and execute direct memory accesses to the platform. A platform allocated shadow memory captures memory accesses during native code instruction execution. Another specially cloned shadow memory copy that supplies host pointers to the core captures memory accesses while executing dynamically translated code instructions. The methodology comprises saving execution contexts, reloading the ISS from a restart point and brunching the ISS execution either on native or translated codes. An online checker compares memory and register states at specially defined check points of interest. A cosimulation tool has been implemented in C++ as a loadable module into the VSP controlled by the ISS simulated events.
Keywords :
C++ language; checkpointing; file organisation; language translation; multiprocessing systems; operating systems (computers); program compilers; virtual prototyping; virtualisation; C++ implementation; CPU register state validation; VSP environment model; cosimulation tool; direct memory access; dynamic translation; instruction set simulator; memory pointers; native code instruction execution; online checker; online memory state validation; operating system; shadow memory cloning; virtual system prototyping; virtualized simulated environment; Context; Load modeling; Program processors; Registers; Testing; Time domain analysis; Time varying systems;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993837