Title :
Redundancy techniques in reliable power supply design
Author :
Paynter, D. ; Mathis, V.
Author_Institution :
Electronics Lab, General Electric, Syracuse, NY, USA
Keywords :
Circuit testing; Contacts; Industrial electronics; Power semiconductor switches; Power supplies; Power system reliability; Redundancy; Signal processing; Switching circuits; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1961.1157298