Title :
Generalized parity-check matrices for SEC-DED codes with fixed parity
Author :
Gherman, Valentin ; Evain, Samuel ; Seymour, Nathaniel ; Bonhomme, Yannick
Author_Institution :
Embedded Syst. Reliability Lab., CEA, Gif-sur-Yvette, France
Abstract :
Hsiao and extended Hamming parity-check matrices can be used to define systematic linear block codes for Single Error Correction-Double Error Detection (SEC-DED). Their fixed code word parity enables the construction of low density parity-check matrices and fast hardware implementations. Fixed code word parity is enabled by an all-one row in extended Hamming parity-check matrices or by the constraint that the modulo-2 sum of all rows is equal to the all-zero vector in Hsiao parity-check matrices. In this paper, we show that these two constraints are particular instantiations of a more general constraint which involves an arbitrary number of rows in the parity-check matrix. As a consequence, sparser parity-check matrices with faster hardware implementations can be found. Moreover, special instantiations of these matrices enable the detection of all triple-bit and quadruple-bit burst errors.
Keywords :
Hamming codes; block codes; error correction codes; error detection codes; linear codes; matrix algebra; parity check codes; Hamming parity-check matrices; Hsiao parity-check matrices; SEC-DED codes; linear block codes; single error correction-double error detection code; Block codes; Decoding; Error correction; Hardware; Reliability; Systematics; Testing; SEC-DED code; parity-check matrix;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
Conference_Location :
Athens
Print_ISBN :
978-1-4577-1053-7
DOI :
10.1109/IOLTS.2011.5993842