DocumentCode
2891300
Title
ENteric Immunity SImulator: A Tool for in silico Study of Gut Immunopathologies
Author
Wendeldorf, Katherine V. ; Bassaganya-Riera, Josep ; Bisset, Keith ; Eubank, Stephen ; Hontecillas, Raquel ; Marathe, Madhav
Author_Institution
Network Dynamics & Simulation Sci. Lab., Virginia Polytech. Inst. & Univ., Blacksburg, VA, USA
fYear
2011
fDate
12-15 Nov. 2011
Firstpage
462
Lastpage
469
Abstract
Clinical symptoms of gastrointestinal (GI) infections are often caused by the inflammatory response elicited to eliminate the invading microbe. Here we present ENISI, a simulator of GI immune mechanisms in response to resident commensal bacteria as well as invading pathogens and the effect on host clinical symptoms. ENISI is a tool for identifying treatment strategies that reduce inflammation-induced damage and, at the same time, ensure pathogen removal by allowing one to test plausibility of in vitro observed behavior as explanations for observations in vivo, propose behaviors not yet tested in vitro that could explain these tissue-level observations, and conduct low-cost, preliminary experiments of proposed interventions/ treatments. An example of such application is shown in which we simulate dysentery resulting from B. hyodysenteriae infection and identify aspects of the host immune pathways that lead to continued inflammation-induced tissue damage even after pathogen elimination.
Keywords
biological tissues; diseases; microorganisms; patient treatment; ENISI; GI infection; clinical symptom; enteric immunity simulator; gastrointestinal; gut immunopathologies; immune mechanism; inflammation-induced damage; inflammatory response; invading pathogen; microbe; pathogen removal; resident commensal bacteria; silico study; tissue-level observation; treatment strategies; Automata; Blood; Computational modeling; Immune system; Microorganisms; Pathogens; Tissue damage; gut; immunopathology; inflammation; simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Bioinformatics and Biomedicine (BIBM), 2011 IEEE International Conference on
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4577-1799-4
Type
conf
DOI
10.1109/BIBM.2011.56
Filename
6120486
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