Title :
PARIS: a parallel pattern fault simulator for synchronous sequential circuits
Author :
Gouders, N. ; Kaibel, R.
Author_Institution :
Dept. of Data Process., Duisburg Univ., Germany
Abstract :
The authors describe PARIS, a parallel-pattern fault simulator for synchronous sequential circuits. PARIS is based on the well-known approach of parallel pattern single fault propagation for combinational circuits and features several new techniques. Every single pattern packet is simulated by an iterative, event-driven method. Heuristic look-ahead of signal values minimizes the number of events that must be tracked. Clever circuit partitioning prevents multiple evaluation of the feedback free parts of the circuit, thus reducing the required simulation effort. Experiments show that PARIS runs at a substantially higher asymptotic speed compared with a state-of-the-art fault simulator for synchronous sequential circuits.<>
Keywords :
circuit analysis computing; fault location; logic CAD; sequential circuits; PARIS; circuit partitioning; combinational circuits; event-driven method; feedback free parts; heuristic look-ahead; parallel pattern fault simulator; parallel pattern single fault propagation; synchronous sequential circuits; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Data processing; Feedback circuits; Information systems; Logic; Sequential circuits;
Conference_Titel :
Computer-Aided Design, 1991. ICCAD-91. Digest of Technical Papers., 1991 IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-2157-5
DOI :
10.1109/ICCAD.1991.185327