Title :
Susceptibility Mapping
Author :
Zaky, S.G. ; Balmain, K.G. ; Dubois, G.R.
Author_Institution :
University of Toronto Toronto, Canada M5S 1A4
Keywords :
Bandwidth; Circuit faults; Circuit noise; Circuit testing; Digital circuits; Electrostatic interference; Immune system; Manufacturing; Printed circuits; Timing;
Conference_Titel :
Electromagnetic Compatibility, 1992. Symposium Record., IEEE 1992 International Symposium on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-0713-5
DOI :
10.1109/ISEMC.1992.626139
