DocumentCode

2891340

Title

Susceptibility Mapping

Author

Zaky, S.G. ; Balmain, K.G. ; Dubois, G.R.

Author_Institution

University of Toronto Toronto, Canada M5S 1A4

fYear

1992

fDate

17-21 Aug. 1992

Firstpage

439

Lastpage

442

Keywords

Bandwidth; Circuit faults; Circuit noise; Circuit testing; Digital circuits; Electrostatic interference; Immune system; Manufacturing; Printed circuits; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1992. Symposium Record., IEEE 1992 International Symposium on

Conference_Location

Anaheim, CA, USA

Print_ISBN

0-7803-0713-5

Type

conf

DOI

10.1109/ISEMC.1992.626139

Filename

626139