Self-checking test circuits for latches and flip-flops

This work proposes design strategies applicable to self-test circuits for the functional validation of latches and flip-flops. The proposed methodology is also useful for, delay test and power consumption analysis that can also be performed over the circuits under test. Moreover, the evaluation of the impacts on circuit operation due to power supply variations and nanometer aging effects can be explored through the self-timed execution mode by monitoring the run frequency. The self-timed and self-checking characteristics make the proposed solutions very attractive for testing standard cell libraries as well as for comparing different implementations of such storage elements. We have validated the addressed strategies at transistor level through electrical simulations.