DocumentCode
2891566
Title
A comparison of the diffusion-limited semiconductor junction diode and the space-charge-limited dielectric diode
Author
Wright, G.
Author_Institution
University of Birmingham, Birmingham, England
Volume
IV
fYear
1961
fDate
15-17 Feb. 1961
Firstpage
12
Lastpage
13
Keywords
Capacitance; Dielectric devices; Electrodes; Electron traps; Frequency; Noise level; Semiconductor device noise; Semiconductor diodes; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1961 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1961.1157313
Filename
1157313
Link To Document