DocumentCode :
2891573
Title :
Ptimized Statistical Method For System-level ESD Tests
Author :
Renninger, Robert G.
Author_Institution :
AT&T Bell Laboratories Murray Hill, New Jersey 07974
fYear :
1992
fDate :
17-21 Aug. 1992
Firstpage :
474
Lastpage :
484
Keywords :
Electrostatic discharge; Electrostatic measurements; Immune system; Immunity testing; Particle measurements; Power system modeling; Probability; Statistical analysis; System testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1992. Symposium Record., IEEE 1992 International Symposium on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
0-7803-0713-5
Type :
conf
DOI :
10.1109/ISEMC.1992.626150
Filename :
626150
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2891573
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