• DocumentCode
    2891871
  • Title

    An emitter piloting advisory expert system for IC emitter deposition

  • Author

    Yang, Ying-Kuei

  • Author_Institution
    Harris Semicond., Melbourne, FL, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    123
  • Lastpage
    130
  • Abstract
    A description is given of the EPAS (Emitter Piloting Advisory System) expert system, which was set up at Harris Semiconductor to advise fab operators how to adjust piloting cycle time for emitters on the basis of knowledge extracted from the most experienced engineer. EPAS consists of an input filter to validate the input parameter values, a knowledge base containing all the knowledge extracted from the expert, a learning mechanism trying to calculate dynamically for the next lot the estimated initial drive time which is closer to the one actually required, a convergence control mechanism to control the rule inference so that the result of an inference is always closer to the conclusion, a user facility module containing many Lisp-based modules developed to let the expert, engineers, and operators maintain the system by themselves, and a friendly interface to provide pleasant interactions with various kinds of users
  • Keywords
    bipolar integrated circuits; electronic engineering computing; expert systems; inference mechanisms; integrated circuit manufacture; learning systems; user interfaces; EPAS; Emitter Piloting Advisory System; Harris Semiconductor; IC emitter deposition; Lisp-based modules; convergence control mechanism; expert system; friendly interface; input parameter values; knowledge base; learning mechanism; reasoning procedures; rule inference; user facility module; Computer integrated manufacturing; Diffusion processes; Expert systems; Filters; Knowledge engineering; Learning systems; Manufacturing processes; Research and development; Semiconductor device manufacture; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Science Symposium, 1989. ISMSS 1989., IEEE/SEMI International
  • Conference_Location
    Burlingame, CA
  • Type

    conf

  • DOI
    10.1109/ISMSS.1989.77260
  • Filename
    77260