Title :
A new method of improving the accuracy for calibrating micropotentiometer
Author :
Ye Daosheng ; Ma Zhengliang
Author_Institution :
National Institute of Metrology
Conference_Titel :
Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
Conference_Location :
Ibaraki, Japan
DOI :
10.1109/CPEM.1988.671179
