Title :
Optimum design and test of a snubberless IGBT PWM-VSI inverterbridge
Author :
Blaabjerg, Frede ; Pedersen, John K. ; Lauritzen, P.O. ; Ma, Cliff L.
Author_Institution :
Inst. of Energy Technol., Aalborg Univ., Denmark
Abstract :
A new optimum design method for a snubberless IGBT PWM-VSI inverterbridge is proposed and verified by simulations and tests. The design method is based upon optimizing the ratio between the output capability of the power devices and the power losses in the devices. The snubberless concept dissipates all the energy in the devices but minimizes the number of main power electronic devices. The concept has fully controlled turn-on and turn-off as well as short-circuit protection. Simplified design expressions are given and used to define the optimized design method. The optimized design is investigated for different conditions and an optimum design is chosen. An advanced measurement system for power electronic devices and systems is used for the test of the snubberless concept. SABER simulations of the inverterbridge verify the snubberless concept both during turn-on and turn-off. Measurements show a close agreement with the simulations and the design expressions. The suggested design expressions can be used for optimum design of PWM-VSI inverters
Keywords :
PWM invertors; bridge circuits; circuit analysis computing; digital simulation; insulated gate bipolar transistors; losses; power engineering computing; power semiconductor switches; protection; short-circuit currents; switching circuits; SABER simulations; fully controlled turn-off; fully controlled turn-on; measurement system; optimum design method; output capability; power devices; power electronic devices; power losses; short-circuit protection; simulations; snubberless IGBT PWM-VSI inverterbridge; tests; Design methodology; Design optimization; Electronic equipment testing; Insulated gate bipolar transistors; Power electronics; Power measurement; Power system protection; Pulse width modulation; Pulse width modulation inverters; System testing;
Conference_Titel :
Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-1993-1
DOI :
10.1109/IAS.1994.377509
