DocumentCode
2892088
Title
Detailed photoemission modeling using the 3D finite-element PIC code MICHELLE
Author
Petillo, J.J. ; Jensen, K. ; Levush, B. ; Panagos, J.N.P.
Author_Institution
SAIC, Burlington
fYear
2007
fDate
25-29 June 2007
Firstpage
904
Lastpage
904
Abstract
Low emittance, high current density sources are required to achieve the small beam size needed for high frequency vacuum electronic devices and for high power free electron lasers (FELs). Emission models are of particular importance in the emittance-dominated regime, where emission non-uniformity and surface structure of the cathode can have an impact on beam characteristics. We have been developing comprehensive time-dependent photoemission models for the simulation codes that account for laser and cathode material and surface characteristics. MICHELLE* is NRLs finite-element self-consistent electrostatic time- domain code: it has the ability to import an RF field, and has unique capabilities for modeling the emission and the self fields, near the cathode. In particular, some instances of surface irregularities and emission non-uniformity (due to work function variation) leading to such effects as beam emittance and high frequency oscillations are possible to model due to the code´s conformal meshing capabilities. We will present results of the implementation of the ´next generation´ photoemission models in the MICHELLE code for modeling surface roughness and non-uniformity.
Keywords
finite element analysis; free electron lasers; particle beam dynamics; photoemission; 3D finite-element PIC code; MICHELLE code; beam emittance; high current density sources; high frequency vacuum electronic devices; high power free electron lasers; self-consistent electrostatic time-domain code; surface roughness; time-dependent photoemission models; Cathodes; Current density; Electron beams; Finite element methods; Free electron lasers; Frequency; Laser beams; Laser modes; Photoelectricity; Surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location
Albuquerque, NM
Print_ISBN
978-1-4244-0916-7
Type
conf
DOI
10.1109/PAC.2007.4440755
Filename
4440755
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