• DocumentCode
    289230
  • Title

    Modeling of the low energy electron dust particle removing system in enclosures

  • Author

    Chang, Jen-Shih

  • Author_Institution
    Dept. of Eng. Phys., McMaster Univ., Hamilton, Ont., Canada
  • fYear
    1994
  • fDate
    2-6 Oct 1994
  • Firstpage
    1360
  • Abstract
    A dust particle removing system based on a low energy electron shower has been investigated theoretically. In the semiconductor, medical and pharmaceutical industries, it is desirable to generate dust free environments in a closed environment for wide gas pressure ranges. In this work, the authors develop a model to calculate dust particle removal rate in a rectangular box equipped with electron emission electrodes with and without external electric fields under a wide range of gas pressure. The dust particle in the system is charged by low energy electrons emitted thermally or optically. The results show that dust particles are effectively charged by electrons even under the reduced gas pressures and the rate of dust particle removal is substantially enhanced by an external electric field. Results for the time-dependent dust particle distribution and removal rate are presented
  • Keywords
    dust; electric charge; electric fields; electrodes; electron emission; electrostatic precipitators; ESP; dust free environment; dust particle removal rate; dust particle removing system; electron emission electrodes; external electric fields; gas pressure; low energy electron shower; model; rectangular box; time-dependent dust particle distribution; Biomedical electrodes; Biomedical engineering; Biomedical optical imaging; Electrical equipment industry; Electron emission; Electron mobility; Gas industry; Pharmaceuticals; Physics; Power engineering and energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-1993-1
  • Type

    conf

  • DOI
    10.1109/IAS.1994.377598
  • Filename
    377598