Title : 
A field-dependent injection-dissociation model for electrical conduction in nonpolar liquids
         
        
            Author : 
Pontiga, F. ; Castellanos, A.
         
        
            Author_Institution : 
Dept. de Electron. y Electromagn., Seville Univ., Spain
         
        
        
        
        
            Abstract : 
The conduction of dielectric liquids has been studied with a model that includes both the generation of charge carriers in the bulk and at the electrodes. Onsager´s theory is applied to the dissociation of ionic pairs in the bulk. On the other hand, the injection of ions from the electrodes is described with a field dependent injection law. Recombination is allowed between electrolytic ions and injected ions. The electrical equations have been numerically integrated with a finite difference technique. The contribution of the dissociation and injection to the total current density has been discussed for several values of the relevant parameters. A procedure is also given to determine the experimental injected charge density from the measurement of the current-voltage characteristic
         
        
            Keywords : 
current density; dielectric liquids; dissociation; finite difference methods; insulating oils; ion recombination; ionic conductivity; Onsager´s theory; charge carriers generation; current-voltage characteristic measurement; dielectric liquids; electrical conduction; electrical equations; electrodes; electrolytic ions; field dependent injection law; field-dependent injection-dissociation model; finite difference technique; injected charge density; injected ions; ion injection; ion recombination; ionic pairs dissociation; nonpolar liquids; total current density; Charge carriers; Charge measurement; Current density; Current measurement; Current-voltage characteristics; Density measurement; Dielectric liquids; Difference equations; Electrodes; Finite difference methods;
         
        
        
        
            Conference_Titel : 
Industry Applications Society Annual Meeting, 1994., Conference Record of the 1994 IEEE
         
        
            Conference_Location : 
Denver, CO
         
        
            Print_ISBN : 
0-7803-1993-1
         
        
        
            DOI : 
10.1109/IAS.1994.377648