Title :
Spur-free all-digital PLL in 65nm for mobile phones
Author :
Staszewski, Robert Bogdan ; Waheed, Khurram ; Vemulapalli, Sudheer ; Dulger, Fikret ; Wallberg, John ; Hung, Chih-Ming ; Eliezer, Oren
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
Abstract :
After the first-ever all-digital PLL (ADPLL) [1] for Bluetooth radios has proven benefits of CMOS scaling and integration, demonstrators for more challenging wireless standards have emerged [2-6]. In the ADPLL, however, the digitally controlled oscillator (DCO) and time-to-digital converter (TDC) quantize the time and frequency tuning functions, respectively, which can lead to spurious tones and phase noise increase. As such, finite TDC resolution can distort data modu lation and spectral mask at near integer-N channels, while finite DCO step size can add far-out spurs and phase noise. Also, a major underreported issue is an injection pulling of the DCO due to harmonics of the digital activity at closely spaced frequencies, which can also create spurs. This work addresses all these problems and demonstrates RF performance matching that of the best-in-class traditional approaches.
Keywords :
Bluetooth; CMOS integrated circuits; digital phase locked loops; mobile radio; oscillators; phase noise; tuning; ADPLL; Bluetooth radios; CMOS integration; CMOS scaling; RF performance matching; closely spaced frequency; data modulation; digital activity; digitally controlled oscillator; far-out spurs; finite DCO step size; finite TDC resolution; frequency tuning functions; mobile phones; near integer-N channels; phase noise; spectral mask; spur-free all-digital PLL; spurious tones; time tuning functions; time-to-digital converter; wireless standards; Clocks; Conferences; Converters; GSM; Noise; Phase locked loops; Synchronization;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746215