Title :
Indirect X-ray photon-counting image sensor with 27T pixel and 15e−rms accurate threshold
Author :
Dierickx, Bart ; Dupont, Benoit ; Defernez, Arnaud ; Ahmed, Nayera
Author_Institution :
Vrije Univ. Brussel, Brussels, Belgium
Abstract :
In X-ray imaging, as in other imaging domains, the ultimate sensitivity and signal-to-noise ratio are obtained when each incoming photon is counted - the so-called quantum limit. Present state-of-the-art digital radiography is largely “charge integration” based, which results in a read noise that is composed of the quantum-limited photon shot noise, but also of electronic read noise and excess noise due to the non-reproducible charge packet sizes per absorbed X-ray photon.
Keywords :
diagnostic radiography; image sensors; photon counting; X-ray imaging; charge integration; digital radiography; electronic read noise; excess noise; indirect X-ray photon-counting image sensor; photon shot noise; quantum limit; signal-to-noise ratio; Accuracy; Noise; Photonics; Pixel; Radiation detectors; Real time systems; X-ray imaging;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746243