Title :
A high-performance universal operational amplifier
Author :
Hilbiber, D. ; Leistiko, D.
Author_Institution :
Fairchild Semiconductor, Palo Alto, CA, USA
Keywords :
Capacitance; Circuits; Degradation; Electron tubes; FETs; Frequency response; Impedance; Operational amplifiers; Performance gain; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157440
