Title :
High-frequency limitations of solid-state devices and circuits
Author_Institution :
Microwave Associates, Inc., Burlington, MA, USA
Keywords :
Conducting materials; Conductivity; Degradation; Equations; Frequency; Geometry; Semiconductor diodes; Semiconductor materials; Solid state circuits; Temperature;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1963.1157456
