DocumentCode

2894351

Title

An application of quantized trapped flux in a superconducting memory

Author

Dumin, D. ; Gibbons, J.

Author_Institution

Stanford University, Stanford, CA, USA

Volume

VI

fYear

1963

fDate

20-22 Feb. 1963

Firstpage

10

Lastpage

11

Keywords

Critical current; Detectors; Gaussian processes; Geometry; Insulation; Magnetic field measurement; Quantization; Quantum mechanics; Superconductivity; Tin;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1963.1157458

Filename

1157458