Title :
A 820GHz SiGe chipset for terahertz active imaging applications
Author :
Öjefors, Erik ; Grzyb, Janus ; Zhao, Yan ; Heinemann, Bernd ; Tillack, Bernd ; Pfeiffer, Ullrich R.
Author_Institution :
Univ. of Wuppertal, Wuppertal, Germany
Abstract :
In this paper, recent advances in SiGe HBT device technology are used to demonstrate a 820GHz TX/RX chipset for active terahertz imaging applications.
Keywords :
Ge-Si alloys; elemental semiconductors; heterojunction bipolar transistors; terahertz wave imaging; Ge; HBT device technology; Si; SiGe chipset; frequency 820 GHz; terahertz active imaging applications; Antenna measurements; Arrays; Harmonic analysis; Imaging; Mixers; Receivers; Transmitters;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746294
