DocumentCode

2894467

Title

Specifying transistor characteristics for worst-case switching circuit design

Author

Roehr, W.

Author_Institution

Motorola Semiconductor Products, Inc., Phoenix, AZ, USA

Volume

VI

fYear

1963

fDate

20-22 Feb. 1963

Firstpage

66

Lastpage

67

Keywords

Capacitance; Capacitors; Charge measurement; Current measurement; Delay effects; Equations; Switching circuits; Temperature; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1963 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1963.1157463

Filename

1157463