Using simulation to test the robustness of various existing production control policies

Author

Lou, Sheldon ; Yan, Houmin ; Sethi, Suresh ; Gardel, Anne ; Deosthali, Prabhat

Author_Institution

Fac. of Manage., Toronto Univ., Ont., Canada

fYear

1991

fDate

8-11 Dec 1991

Firstpage

261

Lastpage

269

Abstract

Compares four production control policies in terms of their robustness against random disturbances such as machine failures and demand fluctuations. A simulation model based on a VLSI wafer fabrication facility is used to test the performance of the policies. Several criteria, including average total WIP (work-in-progress), average backlog, and a cost function that is a combination of the first two criteria, are used to measure the performance

Keywords

VLSI; control system analysis computing; digital simulation; electronic engineering computing; integrated circuit manufacture; production control; VLSI wafer fabrication; average backlog; average total work in progress; cost function; demand fluctuations; machine failures; performance testing; production control policies; random disturbances; robustness; simulation model; Control systems; Fabrication; Mass production; Open loop systems; Production control; Production systems; Robust control; Semiconductor device modeling; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Simulation Conference, 1991. Proceedings., Winter

Conference_Location

Phoenix, AZ

Print_ISBN

0-7803-0181-1

Type

conf

DOI

10.1109/WSC.1991.185623

Filename

185623