Title :
Using simulation to test the robustness of various existing production control policies
Author :
Lou, Sheldon ; Yan, Houmin ; Sethi, Suresh ; Gardel, Anne ; Deosthali, Prabhat
Author_Institution :
Fac. of Manage., Toronto Univ., Ont., Canada
Abstract :
Compares four production control policies in terms of their robustness against random disturbances such as machine failures and demand fluctuations. A simulation model based on a VLSI wafer fabrication facility is used to test the performance of the policies. Several criteria, including average total WIP (work-in-progress), average backlog, and a cost function that is a combination of the first two criteria, are used to measure the performance
Keywords :
VLSI; control system analysis computing; digital simulation; electronic engineering computing; integrated circuit manufacture; production control; VLSI wafer fabrication; average backlog; average total work in progress; cost function; demand fluctuations; machine failures; performance testing; production control policies; random disturbances; robustness; simulation model; Control systems; Fabrication; Mass production; Open loop systems; Production control; Production systems; Robust control; Semiconductor device modeling; Testing; Very large scale integration;
Conference_Titel :
Simulation Conference, 1991. Proceedings., Winter
Conference_Location :
Phoenix, AZ
Print_ISBN :
0-7803-0181-1
DOI :
10.1109/WSC.1991.185623
