Title :
Multi-phase sleep signal modulation for mode transition noise mitigation in MTCMOS circuits
Author :
Hailong Jiao ; Kursun, V.
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Abstract :
Power and ground distribution network noise produced during SLEEP to ACTIVE mode transitions is an important reliability concern in multi-threshold CMOS (MTCMOS) circuits. Different multi-phase sleep signal slew rate modulation techniques for mode transition noise mitigation are investigated in this paper. A triple-phase sleep signal slew rate modulation technique with a novel digital sleep signal generator is proposed. Various important design metrics of different MTCMOS circuits are evaluated under an equal-noise constraint. The proposed digital triple-phase sleep signal slew rate modulation technique increases the overall quality by up to 9.15x and enhances the tolerance to process parameter fluctuations by up to 18x as compared to alternative sleep signal slew rate modulated MTCMOS circuits in a UMC 80nm CMOS technology.
Keywords :
CMOS integrated circuits; digital signals; fluctuations; integrated circuit noise; integrated circuit reliability; interference suppression; mixed analogue-digital integrated circuits; signal generators; MTCMOS circuits; active mode transitions; digital sleep signal generator; digital triple-phase sleep signal slew rate modulation technique; equal-noise constraint; ground distribution network noise; mode transition noise mitigation; multiphase sleep signal modulation; multiphase sleep signal slew rate modulation techniques; multithreshold CMOS circuits; parameter fluctuations; power distribution network noise; size 80 nm; sleep mode transitions; CMOS integrated circuits; CMOS technology; Energy consumption; Modulation; Noise; Switching circuits; Transistors; Power and ground bouncing noise; digital sleep signal slew rate modulator; mode transition energy consumption; process variations; reactivation time; sleep signal slew rate;
Conference_Titel :
SoC Design Conference (ISOCC), 2012 International
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4673-2989-7
Electronic_ISBN :
978-1-4673-2988-0
DOI :
10.1109/ISOCC.2012.6406897
