Title :
A nonlinear transistor model for the prediction of circuit transient response
Author :
Wilfinger, R. ; Kiankhooy-Fard, P.
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Keywords :
Capacitance; Charge carrier lifetime; Differential equations; Diodes; Equivalent circuits; Inverters; Nonlinear equations; Predictive models; Silicon devices; Transient response;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157507
