Title :
Reliable systems from reliable components
Author_Institution :
Bell Telephone Laboratories, Inc., Allentown, PA, USA
Keywords :
Aging; Circuit testing; Costs; Integrated circuit reliability; Life testing; Manufacturing; Production; Redundancy; Satellites; System testing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157509
