Title :
Superconducting transformer for a cryogenic thin-film memory plane
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Keywords :
Circuit testing; Costs; Cryogenics; Current transformers; Equations; Inductance; Power transformer insulation; Refrigeration; Strips; Superconducting thin films;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157512
