Title :
Process variables, model parameters, and integrated circuit performance
Author_Institution :
Motorola, Inc., Phoenix, AZ, USA
Keywords :
Capacitance; Equations; Fabrication; Geometry; Integrated circuit modeling; Integrated circuit synthesis; Mathematical model; Monolithic integrated circuits; Resistors; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157518
