DocumentCode

2895647

Title

Photodiode signal enhancement effect at avalanche breakdown voltage

Author

Johnson, Kenneth

Author_Institution

Texas Instruments Inc., Dallas, TX, USA

Volume

VII

fYear

1964

fDate

19-21 Feb. 1964

Firstpage

64

Lastpage

65

Keywords

Avalanche breakdown; Breakdown voltage; Circuit noise; Degradation; Diodes; Frequency; Noise figure; Photodiodes; Signal to noise ratio; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1964.1157526

Filename

1157526