Title :
Photodiode signal enhancement effect at avalanche breakdown voltage
Author :
Johnson, Kenneth
Author_Institution :
Texas Instruments Inc., Dallas, TX, USA
Keywords :
Avalanche breakdown; Breakdown voltage; Circuit noise; Degradation; Diodes; Frequency; Noise figure; Photodiodes; Signal to noise ratio; Silicon;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157526
